Analyzing Slices

The Slice Analysis panel lets you compute a range of measurements — including maximum, minimum, mean, and median values, as well as the variance and standard deviation — for each slice within an image stack and for the dataset as a whole. You can also compute measurements for regions of interest and multi-ROIs, such as labeled voxel counts. In addition, multiple panels can be opened to compare results for different datasets side-by-side.

To open the Slice Analysis panel, shown below, right-click the required view and then choose Start Slice Analysis in the pop-up menu.

Slice Analysis panel

You can do the following in the Slice Analysis panel:

• Select the measurements you need to analyze your data.
• Plot selected measurements across all slices.
• Use a mask to compute values contained within a region of interest or an inverted mask to compute values outside a region of interest.
• Open multiple panels to compare results from different views of a dataset or from multiple datasets.
• Export your Slice Analysis results to a CSV file for further processing.

You can also easily generate your own parameters for slice analysis with the Generic Slice Analysis Measurement Generator (see Generating Slice Analysis Measurements).

The variance and standard deviation values generated by the Slice Analysis module may be of particular interest to imaging physicists. However, you should note that these numbers represent the noise in the dataset, not the noise in an experiment. The variance of an experiment can only be measured by performing multiple scans and calculating the variance between different samples.